I-Silicon carbide (SiC) i-crystal material eyodwa inobubanzi begebe lebhande elikhulu (~Si izikhathi ezi-3), ukuguquguquka okuphezulu kwe-thermal (~Si izikhathi ezingu-3.3 noma izikhathi ze-GaAs izikhathi ezingu-10), izinga lokufuduka kwe-electron ephezulu (~Si izikhathi ezingu-2.5), ukuphuka okuphezulu kukagesi inkambu (~Si 10 izikhathi noma GaAs izikhathi 5) kanye nezinye izici ezivelele.
Amadivayisi e-SiC anezinzuzo ezingenakubuyiseleka endaweni yokushisa okuphezulu, ukucindezela okuphezulu, imvamisa ephezulu, izinto zikagesi ezinamandla aphezulu kanye nezicelo zemvelo ezeqisayo ezifana ne-aerospace, amasosha, amandla enuzi, njll., akha amaphutha ezinto ezibonakalayo ze-semiconductor yendabuko ekusebenzeni. izinhlelo zokusebenza, futhi kancane kancane ziba ingqalasizinda yama-semiconductors amandla.
Imininingwane ye-4H-SiC Silicon carbide substrate
| Into项目 | Imininingwane参数 | |
| I-Polytype | 4H -SiC | 6H-SiC |
| Ububanzi | 2 intshi | 3 intshi | 4 intshi | 6intshi | 2 intshi | 3 intshi | 4 intshi | 6intshi |
| Ubukhulu | 330 μm ~ 350 μm | 330 μm ~ 350 μm |
| I-Conductivity | N – uhlobo / Semi-insulating | N – uhlobo / Semi-insulating |
| I-Dopant | I-N2 (Nitrogen)V (Vanadium) | I-N2 (Nitrogen) V (Vanadium) |
| Ukuqondisa | Ku-eksisi <0001> | Ku-eksisi <0001> |
| Ukungazweli | 0.015 ~ 0.03 ohm-cm | 0.02 ~ 0.1 ohm-cm |
| I-Micropipe Density(MPD) | ≤10/cm2 ~ ≤1/cm2 | ≤10/cm2 ~ ≤1/cm2 |
| I-TTV | ≤ 15 μm | ≤ 15 μm |
| Umnsalo / Warp | ≤25 μm | ≤25 μm |
| Ubuso | I-DSP/SSP | I-DSP/SSP |
| Ibanga | Ibanga lokukhiqiza / locwaningo | Ibanga lokukhiqiza / locwaningo |
| I-Crystal Stacking Sequence | I-ABCB | ABCABC |
| Ipharamitha ye-Lattice | a=3.076A , c=10.053A | a=3.073A , c=15.117A |
| Isb/eV(Band-gap) | 3.27 eV | 3.02 eV |
| ε (Dielectric Constant) | 9.6 | 9.66 |
| I-Refraction Index | n0 =2.719 ne =2.777 | n0 =2.707 , ne =2.755 |
Imininingwane ye-6H-SiC Silicon Carbide substrate
| Into项目 | Imininingwane参数 |
| I-Polytype | 6H-SiC |
| Ububanzi | 4 intshi | 6inch |
| Ubukhulu | 350μm ~ 450μm |
| I-Conductivity | N – uhlobo / Semi-insulating |
| I-Dopant | I-N2(Nitrogen) |
| Ukuqondisa | <0001> yephule ku-4°± 0.5° |
| Ukungazweli | 0.02 ~ 0.1 ohm-cm |
| I-Micropipe Density(MPD) | ≤ 10/cm2 |
| I-TTV | ≤ 15 μm |
| Umnsalo / Warp | ≤25 μm |
| Ubuso | Si ubuso: CMP, Epi-Ready |
| Ibanga | Ibanga locwaningo |










