Ama-substrate e-Semicera angu-2~6 inch 4° off-angle P-type 4H-SiC akhiwe ukuze ahlangabezane nezidingo ezikhulayo zamandla asebenza kahle kakhulu nabakhiqizi bedivayisi ye-RF. I-4° off-angle orientation iqinisekisa ukukhula kwe-epitaxial okuthuthukisiwe, okwenza le substrate ibe isisekelo esikahle sezinhlobonhlobo zamadivayisi asemiconductor, okuhlanganisa ama-MOSFET, ama-IGBT, nama-diode.
Le substrate engu-2~6 inch 4° off-angle P-type 4H-SiC inezinto ezibonakalayo ezinhle kakhulu, ezihlanganisa ukuguquguquka okuphezulu kwe-thermal, ukusebenza kahle kukagesi, nokuzinza okuvelele kwemishini. I-off-angle orientation isiza ukunciphisa ukuminyana kwe-micropipe futhi ikhuthaze izendlalelo ze-epitaxial ezibushelelezi, okubalulekile ekuthuthukiseni ukusebenza nokuthembeka kwedivayisi yokugcina ye-semiconductor.
Ama-substrate e-Semicera angu-2~6 inch 4° off-angle P-type 4H-SiC atholakala ngezinhlobonhlobo zamadayamitha, asukela kumayintshi angu-2 ukuya kwangu-6 amayintshi, ukuze ahlangabezane nezimfuneko ezihlukene zokukhiqiza. Ama-substrates ethu aklanywe kahle ukuze anikeze amazinga afanayo e-doping kanye nezici zekhwalithi ephezulu, okuqinisekisa ukuthi i-wafer ngayinye ihlangabezana nokucaciswa okuqinile okudingekayo kwezinhlelo zokusebenza ezithuthukisiwe ze-elekthronikhi.
Ukuzibophezela kwe-Semicera ekusunguleni izinto ezintsha kanye nekhwalithi kuqinisekisa ukuthi ama-substrate ethu angu-2~6 inch 4° off-angle P-type 4H-SiC aletha ukusebenza okungaguquki ezinhlobonhlobo zezinhlelo zokusebenza kusukela kugesi wamandla kuya kumadivayisi anemvamisa ephezulu. Lo mkhiqizo uhlinzeka ngesixazululo esithembekile sesizukulwane esilandelayo sama-semiconductors akonga amandla, asebenza kahle kakhulu, asekela intuthuko yezobuchwepheshe ezimbonini ezinjengezezimoto, ezokuxhumana, namandla avuselelekayo.
Amazinga ahlobene nosayizi
Usayizi | 2-Intshi | 4-Intshi |
Ububanzi | 50.8 mm±0.38 mm | 100.0 mm+0/-0.5 mm |
I-Surface Orentation | 4° ngase<11-20>±0.5° | 4° ngase<11-20>±0.5° |
Ubude Befulethi obuyisisekelo | 16.0 mm±1.5mm | 32.5mm±2mm |
Ubude Befulethi besibili | 8.0 mm±1.5mm | 18.0 mm ± 2 mm |
Isisekelo se-Flat Orientation | I-Parallelto <11-20>±5.0° | Parallelto<11-20>±5.0c |
I-Flat Orientation yesibili | 90°CW kusukela ku-± 5.0° okuyinhloko, i-silicon ibheke phezulu | 90°CW kusukela ku-± 5.0° okuyinhloko, i-silicon ibheke phezulu |
I-Surface Qeda | I-C-Face: I-Optical Polish, i-Si-Face: i-CMP | Ubuso C:OpticalPolish, Si-Face: CMP |
I-Wafer Edge | Beveling | Beveling |
Ukuqina Kobuso | I-Si-Face Ra<0.2 nm | I-Si-Face Ra<0.2nm |
Ubukhulu | 350.0±25.0um | 350.0±25.0um |
I-Polytype | 4H | 4H |
I-Doping | p-Uhlobo | p-Uhlobo |
Amazinga ahlobene nosayizi
Usayizi | 6-Intshi |
Ububanzi | 150.0 mm+0/-0.2 mm |
I-Surface Orientation | 4° ngase<11-20>±0.5° |
Ubude Befulethi obuyisisekelo | 47.5 mm ± 1.5mm |
Ubude Befulethi besibili | Lutho |
Isisekelo se-Flat Orientation | Ihambisana no-<11-20>±5.0° |
I-SecondaryFlat Orientation | 90°CW kusukela ku-± 5.0° okuyinhloko, i-silicon ibheke phezulu |
I-Surface Qeda | Ubuso be-C: I-Optical Polish, i-Si-Face:CMP |
I-Wafer Edge | Beveling |
Ukuqina Kobuso | I-Si-Face Ra<0.2 nm |
Ubukhulu | 350.0±25.0μm |
I-Polytype | 4H |
I-Doping | p-Uhlobo |